Abstract
A simple formalism that predicts optical constants of a two-dimensionally distributed nanoparticle (NP) thin film is presented for analysis of the NP-amplified surface plasmon resonance. The dielectric constant of the NP thin film can be evaluated with simple expressions at low coverages (σ 0.08. Analytical and numerical calculations are carried out for evaluating the local fields at different conditions. The Clausius−Mossoti relation, which is usually used for evaluation of dielectric constants of a binary medium, does not hold in the NP thin films, because of the large interparticle distance and/or the retardation effect. We carried out SPR measurements for NP films with different NP coverages, and the results support the proposed analytical formalism. Finally we propose a procedure to evaluate the NP coverage from the NP-SPR profile experimentally obtained.
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