X-ray diffraction in AT-cut quartz single crystal at acoustic excitation at the fundamental frequency

Abstract

X-ray diffraction on different atomic planes of an AT-cut quartz crystal is studied experimentally in the Laue geometry in case of excitation by acoustic waves at the first resonant (fundamental) frequency. Acoustic waves lead to an increase in the integral intensity of the reflection-diffracted beam. The amplification coefficients in reflection are measured in dependence on the amplitude of a.c. voltage applied to the crystal at the resonant frequency. The frontal distributions of the intensity of the beam diffracted in the reflection direction are obtained for different atomic planes.