Abstract
The results of X-ray photoelectron spectroscopy (XPS) study of Cr(30 Å)/[Pd(4 Å)/Gd(50 Å)/Pd(4 Å)/Fe(35 Å)] and Cr(30 Å)/[Pd(20 Å)/Gd(50 Å)/Pd(20 Å)/Fe(35 Å)] multilayered nanostructures grown with magnetron sputtering are presented. The measurements of XPS Cr 2p-spectra have shown that an oxide film (Cr2O3) is formed on the surface of the protective Cr-layer. As the XPS Pd 3d-spectra show, the palladium layer closest to the capping Cr-coating is partially oxidized to form PdO-oxide. The next Gd-layer turned out to be also partly oxidized with the formation of Gd2O3 oxide. The results of XPS measurements of the core level spectra are confirmed by studies of the XPS valence band spectra, which, along with involvements from reference Cr2O3, PdO and Gd2O3 oxides, also show contributions from non-oxidized Cr and Pd metals.
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