Abstract
A new soft x-ray plate of Ag/chalcogenide film is proposed, which offers in situ monitoring of high-resolution x-ray images. Soft x-ray exposure of synchrotron and undulator radiation causes color change in the Ag/chalcogenide film, capable of yielding a potential resolution on the order of 100 Å. In situ monitoring of the diffraction light of a He-Ne laser-beam irradiation on the film revealed the processes involved in recording x-ray images of gratings during the exposure. The reflection light caused by scanning with the laser beam provided good reconstructed images. A possible application to future x-ray holography is also described.
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