Abstract
A toroidal bent Si (111) crystal has been made and used to obtain a spot size reduction and therefore an increased flux density of synchrotron radiation for microprobe trace analysis. Measured beam profiles and fluxes are compared with the results of a ray tracing program, used to simulate the experimental situation. It is shown, that the spotsize has been reduced by a factor of 50 horizontally, and by a factor of 11 vertically, which is in good agreement with the calculations. It indicates a good shape accuracy of the doubly bent crystal. The measured photon flux density of 200 photons/(smA μm 2) is shown to be sufficient to detect trace elements of ppm concentration in an organic matrix with a detection volume of the order of 10 μm diameter.
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