Abstract
Weak localization, fluctuation conductivity, and related problems have been investigated based on a comprehensive set of experiments on transition metal Nb films and wires. The temperature dependence of the inelastic scattering rate 1/${\mathrm{\ensuremath{\tau}}}_{\mathrm{\ensuremath{\varphi}}}$ of films with various thicknesses (25--80 \AA{}), estimated from magnetoresistance data above ${\mathit{T}}_{\mathit{c}}$, is well fitted to a function of ${\mathit{C}}_{0}$+${\mathit{C}}_{1}$T+${\mathit{C}}_{3}$${\mathit{T}}^{3}$. The coefficient ${\mathit{C}}_{1}$ is in excellent quantitative agreement with the theoretical prediction of the electron-electron scattering mechanism for two-dimensional dirty metals. The coefficient ${\mathit{C}}_{3}$ shows no thickness dependence and is in semiquantitative agreement with theories of three-dimensional electron-phonon scattering mechanisms. The upper critical field of thin Nb wires with a width of less than 1000 \AA{} exhibits unconventional temperature dependence close to ${\mathit{T}}_{\mathit{c}}$. We also discuss this behavior.
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