VLSI semiconductor random access memory functional testing

Abstract

An overview of VLSI testing is presented, using Random access memory (RAM) chip functional testing procedures Marching and GALPAT. A revised GALPAT test procedure is developed for RAM chips. An important aspect of each test procedure is to detect permanent faults in the RAM chip. Functional-level fault models for RAMs, are described. Details of the set-up of an automated VLSI test-station for the Marching, GALPAT and Revised GALPAT tests on the Intel 2114A-5 1 K static RAM are presented. Technical difficulties during Intel 2114A-5 chip testing are highlighted. The fault coverage and execution time of each test procedure are discussed.