Abstract
The cerium density and valence in micrometer-size platinum-supported cerium-zirconium oxide Pt/Ce2 Zr2 Ox (x=7-8) three-way catalyst particles were successfully mapped by hard X-ray spectro-ptychography (ptychographic-X-ray absorption fine structure, XAFS). The analysis of correlation between the Ce density and valence in ptychographic-XAFS images suggested the existence of several oxidation behaviors in the oxygen storage process in the Ce2 Zr2 Ox particles. Ptychographic-XAFS will open up the nanoscale chemical imaging and structural analysis of heterogeneous catalysts.
Published Version
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