Abstract
AbstractThe cerium density and valence in micrometer‐size platinum‐supported cerium–zirconium oxide Pt/Ce2Zr2Ox (x=7–8) three‐way catalyst particles were successfully mapped by hard X‐ray spectro‐ptychography (ptychographic‐X‐ray absorption fine structure, XAFS). The analysis of correlation between the Ce density and valence in ptychographic‐XAFS images suggested the existence of several oxidation behaviors in the oxygen storage process in the Ce2Zr2Ox particles. Ptychographic‐XAFS will open up the nanoscale chemical imaging and structural analysis of heterogeneous catalysts.
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