Abstract
Major updates in version 2.0 of rheed++ framework include a universal algorithm designed to calculate intensity changes of RHEED oscillations both during the growth of thin heteroepitaxial layers and for the rocking curves. The changes in the RHEED oscillation amplitude show how diffracted beam intensities depend on the glancing angle of the incident electron beam, the coverage model of the growing layers, and the model of the scattering potential. The current release introduces improved framework readability, which was achieved by removing the noticed structural shortcomings. The software does not require linking to any of the existing numerical library routines.
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