Abstract
High-purity ultrathin single-crystal metal films with atomically flat surfaces and precisely known thickness were prepared under UHV conditions. Oscillations of the electrical resistivity of thin epitaxial Pb and Au films on Si(111) surfaces and of the intensity of the specular beam in high-energy electron diffraction from these films are reported. In Au layers resistance oscillations occur synchronously with RHEED intensity oscillations. They are attributed to the periodic variations of the specularity factor during Au film growth. In Pb in addition to RHEED and resistivity oscillations with 1 ML periodicity caused by the periodic reproduction of the surface microstructure, QSE oscillations have been seen in the electrical resistivity. In Ag layers only RHEED oscillations were seen.
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