Abstract

The features of neutron Bragg diffraction in a perfect and bent (deformed) silicon single crystal have been studied under ultrasound excitation. In contrast to a perfect crystal where an increase in the diffraction intensity has been observed with an increase in the ultrasound wave’s amplitude, in a deformed silicon crystal the intensity sharply decreases (two times) already at small voltages on a piezoelectric transducer. The depth and position of minima of the total intensity depend on the ultrasound wave’s amplitude and the bending radius of a crystal. To explain the observed effects the modified Penning-Polder-Kato model has been successfully used, in which the role of ultrasound is reduced to the formation of resonance transitions of imaging points between different sheets of dispersion surface. Experimental proofs of validity of the used model are presented. Estimations of the probabilities of one- and multiphonon scattering processes obtained from experimental data have a good agreement with theoretical ones.

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