Abstract
A new optical technique is used to detect picosecond ultrasonic pulses in thin opaque films by direct time-resolved detection of ultrafast vibrations of the film surface. For thin films of tungsten we show how the strain pulse shape in the film can be measured without significant distortion at frequencies around 100 GHz. The potential for characterization of thin film bonding and adhesion is demonstrated by the detection of an ultrathin interfacial amorphous silicon layer, of nanometre order in thickness, which is sandwiched between two different materials.
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