Abstract
The authors have studied transient photoinduced absorption in single monolayers of oxidized silicon nanocrystals. Transient photoinduced absorption measurements along with optical absorption and photoluminescence (PL) emission reveal that the light-absorption process takes place in defects related to strong PL emission, suggesting that the photoexcited carriers are in oxygen-related interface states. They have time-resolved ultrafast relaxation paths in oxygen-related states and quantized sublevels, which have important implications in the understanding of fundamental optical properties for this system.
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