Abstract
The authors show that, contrary to the usual assumption, the local noise sources at two different points are not uncorrelated, but indeed are correlated over short distances, of the order of magnitude of a fraction of a micrometer. The two-point correlation function is expressed for hot carriers in semiconductors when randomizing scatterings are involved. The expression of the frequency-dependent diffusion coefficient for hot carriers is given as an explicit integral form involving the distribution function.
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