Abstract
A marker system based on the binary translation of two-dimensional coordinate numbers was developed to facilitate the positional determination of individual nanomaterial adsorbed randomly on a substrate. The design of the coordinate markers enabled simple calculations of the position of the selected individual nanomaterial from an atomic force microscope image. This position information was used to fabricate metal contact structures for the selected nanomaterial. We demonstrated that the coordinate markers were successfully used to prepare field-effect transistors with a thin bundle of single-walled carbon nanotubes.
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