Abstract
The molecular images obtained by scanning tunneling microscope (STM) exhibit bias voltage dependence, and at low bias voltage, the molecular images disappear. This voltage dependence of STM molecular images is investigated by the tunnel gap imaging (TGI) technique using STM equipment. TGI is a technique that maps out the vertical variation of the tunnel current by measuring the tunnel gap width dependence of the tunnel current at each pixel. It is shown that the tip is repelled from the surface by 5-6 nm when the bias voltage is increased by about 1 V. Marked increase in the apparent corrugation accompanies this phenomenon. The mechanism of STM molecular image formation is discussed in terms of the vertical distribution of the local density of states (LDOS).
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