Abstract
The influence of sintering temperature on the microwave dielectric properties and microstructure of the (1−y)Zn2SnO4–yCa0.8Sr0.2TiO3 ceramic system were investigated with a view to their application in microwave devices. A (1−y)Zn2SnO4–yCa0.8Sr0.2TiO3 ceramic system was prepared by the conventional solid-state method. The X-ray diffraction patterns of the 0.85Zn2SnO4–0.15Ca0.8Sr0.2TiO3 ceramic system did not significantly vary with sintering temperature. A dielectric constant of 9.6, a quality factor (Q×f) of 15,900GHz, and a temperature coefficient of resonant frequency of −4ppm/°C were obtained when the 0.85Zn2SnO4–0.15Ca0.8Sr0.2TiO3 ceramic system was sintered at 1175°C for 4h.
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