Influence of B2O3 on microstructure and microwave dielectric properties of 0.4Nd0.96Yb0.04(Mg0.5Sn0.5)O3–0.6Ca0.8Sr0.2TiO3 ceramic system

Abstract

The effect of B2O3 on the microstructure and microwave dielectric properties of the 0.4Nd0.96Yb0.04(Mg0.5Sn0.5)O3–0.6Ca0.8Sr0.2TiO3 ceramic system were investigated with a view to their use in microwave devices. A B2O3-doped 0.4Nd0.96Yb0.04(Mg0.5Sn0.5)O3–0.6Ca0.8Sr0.2TiO3 ceramic system was prepared by the conventional solid-state method. The X-ray diffraction patterns of the B2O3-doped 0.4Nd0.96Yb0.04(Mg0.5Sn0.5)O3–0.6Ca0.8Sr0.2TiO3 ceramic system did not significantly vary with sintering temperature. A 1.25 wt% B2O3-doped 0.4Nd0.96Yb0.04(Mg0.5Sn0.5)O3–0.6Ca0.8Sr0.2TiO3 ceramic system that was sintered at 1,525 °C for 4 h had a dielectric constant of 38.0, a quality factor (Q × f) of 68,600 GHz, and a temperature coefficient of resonant frequency of 2 ppm/°C.