Abstract
The influence of B2O3 on the microstructure and microwave dielectric properties of the 0.45La0.97Sm0.03(Mg0.5Sn0.5)O3–0.55Ca0.8Sm0.4/3TiO3 ceramic system were investigated with a view to their application in microwave devices. A B2O3-doped 0.45La0.97Sm0.03(Mg0.5Sn0.5)O3–0.55Ca0.8Sm0.4/3TiO3 ceramic system was prepared using the conventional solid-state method. The X-ray diffraction patterns of the B2O3-doped 0.45La0.97Sm0.03(Mg0.5Sn0.5)O3–0.55Ca0.8Sm0.4/3TiO3 ceramic system did not significantly vary with sintering temperature. A dielectric constant of 35.5, a quality factor (Q×f) of 5,500 GHz, and a temperature coefficient of resonant frequency of −1 ppm/°C were obtained when the 2 wt% B2O3-doped 0.45La0.97Sm0.03(Mg0.5Sn0.5)O3–0.55Ca0.8Sm0.4/3TiO3 ceramic system was sintered at 1450°C for 4 h.
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