Abstract
Interfacial oxygen migration and its induced anomalous Hall effect are reported in perpendicular multilayers with different interfacial oxygen-coordinated. Saturation Hall resistance RAH for Pt/Co/MgO/Pt and Pt/Co/Al2O3/Pt multilayers is 3.66Ω and 4.34Ω in as-deposited state, respectively. After annealing at 400°C, RAH value reaches 4.82Ω and 6.67Ω, which is 32% and 54% larger than that in as-deposited samples, respectively. Especially, the increment value ΔRAH in Pt/Co/Al2O3/Pt multilayers is 101% larger than that in Pt/Co/MgO/Pt film. Interfacial structural analysis shows such differentΔRAH in two samples originates from distinct oxygen migration behavior induced different interfacial oxygen-coordinated.
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