Abstract
Abstract Molecular-resolution imaging on an alkanethiol self-assembled monolayer (SAM) in an ionic liquid (IL) was demonstrated using frequency modulation atomic force microscopy (FM-AFM). A quartz tuning fork sensor with a sharpened tungsten tip, the so-called qPlus sensor, was used as a force sensor. Etch pits, which are a typical structure of alkanethiol SAMs, individual alkanethiol molecules, and single molecular defects were clearly imaged; that is, true molecular-resolution imaging was successfully achieved. We also carried out force curve measurement using the FM-AFM and the presence of a solvation layer on the IL/SAM interface was recognized.
Published Version
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