Abstract
This paper aims to investigate the effect of Cr doping on the magnetic properties of Zn1-xCrxO (0 ≤ x ≤ 0.026) thin films deposited using a magnetron co-sputtering method under Ar+O2 growth atmosphere. All of the films are highly c-axis-oriented wurtzite structures. The x-ray photoelectron spectroscopy results revealed that some Cr ions have substituted into Zn sites, showing the Cr2+ signal, in all of the Cr-doped ZnO films. The remaining Cr ions are in a 3+ valence state. A distinct paramagnetic response, as well as weak ferromagnetic signal persisting up to RT, has been observed for the pure ZnO film, while only a distinct paramagnetic response is present for the Zn1−xCrxO films with x = 0.026. The variation in ferromagnetic signals seems to coincide with that in the surface morphology features for the films. The results suggest that ferromagnetism in the Zn1−xCrxO films can be rationalized in terms of surface defect states, and the substituted Cr2+ ions would contribute only to paramagnetism or show an antiferromagnetic coupling.
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