Traceability to national standards for S-parameter measurements in waveguide at frequencies from 220 GHz to 330 GHz

Abstract

This paper describes a new facility that has been introduced recently to provide precision traceable scattering parameter measurements of waveguide devices in the frequency range 220 GHz to 330 GHz (i.e. in waveguide size WR-03). The facility comprises measurement instrumentation situated at the University of Leeds, UK, and associated primary reference standards provided by the National Physical Laboratory, UK. The instrumentation consists of a Vector Network Analyzer (VNA) and the standards are precision sections of waveguide that are used to calibrate the VNA. Traceability to national standards and the International System of units (SI) is achieved via precision dimensional measurements of the waveguide sections. Typical measurements, with uncertainties, are given to illustrate the current state-of-the-art for traceable measurements of this type.