Abstract
This paper describes a new measurement system to provide high precision traceable scattering parameter measurements of waveguide devices in the frequency range from 750 GHz to 1.1 THz (i.e. in waveguide size WR-01, WM-250). The measurement system comprises Vector Network Analyzer (VNA) at Yamaguchi University and associated primary reference standards provided by the National Metrology Institute of Japan (NMIJ). The standards are precise line sections of waveguide that are used in pre-calibration of the VNA. Traceability to the International System of units (SI) is achieved via precision dimensional measurements of the waveguide aperture and flange. Measurement results with uncertainties are given for traceable measurements in waveguides.
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