Abstract
Methods are presented for achieving a better accuracy in the ion energy analysis and an excellent time resolution in the ion reaction time measurement using the time-of-flight spectrometer. Analyses are also presented to show that the mechanisms of ion formation can be derived directly from the spectral line shape. Specific examples drawn from high resolution pulsed-laser time-of-flight atom-probe spectrometer measurements are used to illustrate these methods and analyses. The richness of information contained in a high resolution time-of-flight spectrum is demonstrated with a study of field dissociation by atomic tunneling of RhHe 2+ ions. The time resolution in this dissociation time measurement is as good as 20 fs, and a feature related to half a period of the rotational motion of the ion can be observed in the time-of-flight spectrum from fully resolved peaks.
Published Version
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