Abstract
Backward-wave oscillator spectroscopy was applied to the transmission measurements of the complex dielectric spectra in the frequency range 8-33 cm m 1 at temperatures from 10 K to 300 K. The samples under investigation were relaxor PLZT 9.5/65/35 ceramics, antiferroelectric PbZrO 3 ceramics and thin films of Ba x Sr 1 m x TiO 3 (x = 0; 0.1; 1) on sapphire substrates. Room temperature measurements on the same samples were performed using a time-domain terahertz transmission spectroscopy in the range 3-80 cm m 1 . A good agreement of both data sets is obtained. Temperature behavior of the complex permittivity is discussed; both experimental methods are compared.
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