Abstract
The current density of the resistance switching of the Pt nanogap electrode was investigated to determine the nature of the electromigration responsible for the switching. The current density that is estimated from the measured current and emission area calculated using the tunneling equation is 12.1×1011 A/m2, and is nearly twice that of the Au nanogap electrode. This material dependence of the current density is related to the activation energy for electromigration, which implies that the resistance switching of nanogap electrodes is caused by electromigration.
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