Abstract
The current density of the resistance switching of the Pt nanogap electrode was investigated to determine the nature of the electromigration responsible for the switching. The current density that is estimated from the measured current and emission area calculated using the tunneling equation is 12.1×1011 A/m2, and is nearly twice that of the Au nanogap electrode. This material dependence of the current density is related to the activation energy for electromigration, which implies that the resistance switching of nanogap electrodes is caused by electromigration.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.