Thick-target method in the measurement of inner-shell ionization cross-sections by low-energy electron impact

Abstract

In this paper, we have studied the thick-target method for the measurements of atomic inner-shell ionization cross-section or X-ray production cross-section by keV electron impact. We find that in the processes of electron impact on the thick targets, the ratios of the characteristic X-ray yields of photoelectric ionization by bremsstrahlung to the total characteristic X-ray yields are Z-dependent and shell-dependent, and the ratios also show the weak energy-dependence. In addition, in the lower incident energy region (i.e. U < 5–6), the contribution from the rediffusion effect and the secondary electrons can be negligible. In general, the thick-target method can be appropriately applied to the measurements of atomic inner-shell ionization cross-sections or X-ray production cross-sections by electron impact for low and medium Z elements in the lower incident electron energy (i.e. U < 5–6). The experimental accuracies by the thick-target method can reach to the level equivalent or superior to the accuracies of experimental data based on the thin-target method. This thick-target method has been applied to the measurement of K-shell ionization cross-sections of Ni element by electron impact in this paper.