Measurements of absolute M-subshell X-ray production cross sections of Th by electron impact

Abstract

Measurements of absolute M-subshell X-ray production cross sections for element Th were made by electron impact for energies ranging from the ionization threshold up to 38keV. Experimental data were obtained by measuring the X-ray intensity emitted from ultrathin Th films deposited onto self-supporting C backing films. The measurements were conducted with an electron microprobe using high-resolution wavelength dispersive spectrometers. Recorded intensities were converted into absolute X-ray production cross sections by means of atomic data and estimation of the number of primary electrons, target thickness, and detector efficiency. Our experimental X-ray production cross sections, the first to be reported for the M subshells of Th, are compared with X-ray production cross sections calculated with the mean of ionization cross sections obtained from the distorted-wave Born approximation. The Mα X-ray production cross section calculated is in excellent agreement with the measurements, allowing future use for standardless quantification in electron probe microanalysis.