Abstract
Single-crystal films of copper and (60Cu–40Ni) alloy were epitaxially grown on cleaved (001) surface of mica by vacuum deposition. Resistivity was measured for films with different crystal orientations prepared under various evaporating conditions, that is, operating pressure, substrate temperature, deposition rate and so on. The results obtained were as follows; (1) Epitaxially grown single-crystal films of copper with (111) orientation showed low resistivity compared with that of polycrystalline films, and size-effect anisotropy was observed when resistivities of films with <110> and <112> orientations were compared. (2) Thermoelectric voltage of Cu–(60Cu–40Ni) single-crystal film thermocouple was found to depend on crystal structures and crystal orientations of films.
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