Abstract
The modified Z-scan technique using the quasi-one-dimensional slit (QODS) beam for characterizing the third-order optical nonlinearity has been reported recently. In the present work, we investigate the effect of the finite length of the slit in the QODS beam Z-scan for the practical experimental conditions, and then give an empirical expression that allows the direct estimation of nonlinear refraction coefficient from the measured normalized peak-valley transmittance difference. In particular, we explore relatively in detail the influences of the sample imperfection on the Z-scan traces, such as the hollow hole of the sample and the nonuniform nonlinearity. Compared with the other Z-scan techniques, such as the top-hat and Gaussian-beam Z-scans, we find that the QODS beam Z-scan has the great improvement for the sample imperfections. The results suggest that the QODS beam Z-scan is a more promising and useful technique for characterizing the optical nonlinearity of an imperfect sample.
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