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Abstract
The possibility of quantitative texture analysis by means of parametric x-ray radiation (PXR) from relativistic electrons with Lorentz factor γ > 50MeV in a polycrystal is considered theoretically. In the case of rather smooth orientation distribution function (ODF) and large detector (θD >> 1/γ) the universal relation between ODF and intensity distribution is presented. It is shown that if ODF is independent on one from Euler angles, then the texture is fully determined by angular intensity distribution. Application of the method to the simulated data shows the stability of the proposed algorithm.
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