Abstract
In this paper, the effects of grain orientation on preferred abnormal grain growth in HCP-polycrystalline thin films have been analysed with respect to strain energy. The calculated results showed that C hkl, the average values of the orientation factor, decreased with increase of 1 for the same h and k and increased with increase of h or/and k for constant 1. Where (hkl) denoted a particular grain orientation, that is, the grains with (hkl) planes oriented parallel to the film surface. This is preannounced that, considering the strain energy solely, the grains with higher 1 and lower h and k should be favorable in HCP-polycrystalline thin films on rigid substrates after annealing.
Published Version
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