Abstract
We report on results of systematic X-ray investigations of the Bi 2Sr 2CaCu 2O 8+ x (2212) single crystals grown by slow cooling, top seeded solution growth and travelling solvent floating zone (TSFZ) methods. The typical concentrations of dislocations in the Bi-2212 crystals are estimated from width of peaks. According to the obtained X-ray topography and diffractometry data, these crystals demonstrate misorientation anisotropy around different crystallographic axes, which is a consequence of incommensurate modulation in this compound. The highly perfect crystals grown by TSFZ method are found to demonstrate the abnormal transmission X-ray diffraction effect (Borrman effect).
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