Abstract
Using a combination of spectral simulation with FEFF and experimental data for metallic Ce, it has been possible to extract the Cerium Oxide-only M4,5 X-ray Emission Spectrum (XES) from an experimental result, which had been produced utilizing a combined CeOxide/Ce sample. It is shown that the XES emission for CeOxide-only is significantly different for the M4 and M5 edges, with the M4 XES consistent with normal XES and the M5 XES exhibiting a continued enhancement associated with a threshold effect, connected to Resonant Inverse Photoelectron Spectroscopy (RIPES).
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Electron Spectroscopy and Related Phenomena
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
