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https://doi.org/10.1016/0304-3991(82)90177-2
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Cite Journal: Ultramicroscopy |  Publication Date: Jan 1, 1982 |
 Citations: 8 |
Affiliation: University of Bologna
A simple method for increasing the defocus range of the diffraction lens of a Philips EM 400 electron microscope is described and applied to the experimental observations of ferromagnetic domain walls by means of an amplitude division electron interferometer.
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