Abstract
In this paper, ZnSe/SiO2 composite thin films was prepared by sol–gel process. X-ray diffraction results indicate the phase structure of ZnSe particles embedded in SiO2 composite thin films is sphalerite (cubic ZnS). The dependence of ellipsometric angle ψ with wavelength λ of ZnSe/SiO2 composite thin films was investigated through spectroscopic ellipsometers. The optical constant, thickness, porosity and the concentration of ZnSe/SiO2 composite thin films were fitted according to Maxwell-Garnett effective medium theory. The thickness of ZnSe/SiO2 composite thin films was measured through surface profile.
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