Abstract
In this paper, Bi2Sr2Ca1Cu2O8+σ (Bi-2212) superconducting thin films was prepared by using a sol-gel method on a LaAlO3 (LAO) single crystal substrate, with acetates of bismuth, strontium, calcium, and copper as the starting raw materials. A step structure was specifically designed to measure the intrinsic Josephson effect. The microstructure of the Bi-2212 thin films and their epitaxial growth on the LAO substrate were analyzed by a Cs-corrected transmission electron microscope (Cs-TEM) with an atomic-level resolution and the electrical properties were measured. The results showed that the prepared Bi-2212 thin films had good epitaxial growth characteristics and good in-plane and out-plane growth texture and that its critical transition temperature, Tc, was 87 K. The interface between the substrate and the film was well-defined; the films grow epitaxially on the substrate from the CuO layer, with a highly ordered atom arrangement. The I–V characteristic curve of the prepared step micro-bridging sample showed zero-voltage overcurrent phenomenon, and the critical current was 2.3 mA. In addition, multiple current-voltage jumps were observed on the curve, indicating that the prepared biaxial texture thin films showed the intrinsic Josephson effect.
Published Version
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