The direct RF power injection method up to 18 GHz for investigating IC's susceptibility

Abstract

The direct RF power injection (DPI) measurement up to 18 GHz is proposed to investigate the IC immunity. The DPI method is reviewed and the consideration of extending frequency range is discussed. Furthermore, the details of the measurement setup are depicted in this work. The critical part, on-board injection network in the power injection path with a 3 dB bandwidth of 18.7 GHz is realized. A low dropout regulator (LDO) is used to demonstrate the test setup. The proposed DPI test with the experimental results shows the significance up to 18 GHz.