Abstract
Previous studies have suggested the prerequisite of bone interfacing successful endosteal dental implants. This is the concept of osseointegration of dental implants within the jaw. However, the morphology of the actual bone interface on the ultrastructural level is lacking. This current study attempts to elucidate, with correlative high voltage electron microscopy (HVEM) and conventional electron microscopy (TEM), the morphology of the bone-dental implant interface.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
Paper Title
Journal
Date
