Abstract

Artificial neural network chips can achieve high-speed performance in solving complex computational problems for signal and information processing applications. These chips contain regular circuit units such as synapse matrices that interconnect linear arrays of input and output neurons. The neurons and synapses may be implemented in an analog or digital design style. Although the neural processing has some degree of fault tolerance, a significant percentage of processing defects can result in catastrophic failure of the neural network processors. Systematic testing of these arrays of circuitry is of great importance in order to assure the quality and reliability of VLSI neural network processor chips. The proposed testing method consists of parametric test and behavioral test. Two programmable analog neural chips have been designed and fabricated. The systematic approach used to test the chips is described, and measurement results on parametric test are presented.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.