Testable design of two-dimensional cellular logic arrays for detecting stuck-at and bridging faults

Abstract

In this paper the problem of detecting bridging faults in two-dimensional (2-D) cellular logic arrays realizing an arbitrary Boolean function is considered in a new framework. A testable design of such combinational logic arrays has been proposed in which a set of universal tests can be initiated to detect all single stuck-at and bridging faults. The augmentation of the network for inducing testability is simple and is also independent of the function realized.