Abstract
This paper discusses how the test station health and care play an important part in minimizing no fault found (NFF) cases on units under test (UUTs). The paper presents successfully tested methods to collect and analyze test results, and display test information for test station instruments, interface test adapters (ITAs), and UUTs. The technology is currently being prototyped for the Ogden F-16 avionic depot facilities. The analysis methods provide support to identify causes of NFF resulting from discrepancies in testing procedures at different test levels (such as flight line, intermediate and depot maintenance levels). The methods also provide test program set (TPS) software for engineers to identify stack tolerance dependences, which cause misleading diagnostics and incorrect repair actions. The paper discusses the latest experimental results and contributions to the F-16 reduction of total ownership cost (R-TOC).
Published Version
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