Side-by-side systems and TPSs can enhance diagnostic detection and accuracy

Abstract

To fully utilize the open system concept and the engineering skill of various organizations, we should utilize people who can achieve a greater understanding of diagnostic reliability. It is and has always been a fact that test engineering skill varies. It is a fact that different Automatic Test Equipment (ATE) designs have inherent weaknesses even though different ATE are manufactured with the same test capability. Inherent weaknesses in ATE designs can be deceiving and remain unknown. Inherent weaknesses will cause diagnostic and Test Program Set (TPS) performance problems. These performance problems can be associated with No-Fault-Found (NFF), limit variations and incorrect diagnostic callouts. So, what might these ATE inherent weaknesses be? These weaknesses could be routing, grounding, instrumentation, power supplies, wiring, crosstalk, timing, speed, noise, connections, ICA/ITA design, etc. Utilizing a different ATE side-by-side evaluation method will be extremely beneficial in resolving inherent weaknesses. So, how is ATE side-by-side testing performed? Side-by-side testing is performed by running a certain TPS on different ATE. The Interface Test Adapter (ITA) design should be designed for each ATE with no transition adapter. If a shop contains many ATE of the same manufacturer there is no need to purchase an equivalent number of ATE from another manufacturer. If a single ATE from another manufacturer is purchased and used to perform side-by-side testing this should accomplish the desired purpose. However, all options should remain on the table. Developing and integrating a TPS to run on side-by-side ATE will highlight ATE, TPS or ITA weaknesses. The engineer will question ATE performance and quality if one ATE has greater accuracy and performance during TPS integration or usage. TPS integration is one of the prime places to determine TPS quality and debug problems. Engineers do see many situations and performance issues which if never resolved continue to propagate as other TPSs are developed. It is a sign of a great manufacturer if they can correct ATE design deficiencies as they are identified. TPS performance problems will crop up during use. ITA designs are critical during the TPS development phase. A quality TPS is a combination of the Test Program design and the ITA design. An initial investment in a different manufacturer ATE is a life cycle investment strategy. Selecting a better performing ATE without regard to the ATE name or the ATE designation is the proper way to procure an item. In fact, having an unbiased highly skilled engineer develop and integrate a TPS for each ATE would be the reliable way to determine ATE quality. Test technology continues to evolve and if we are to support technology advancements we must do the things that bring about system performance improvements and better understanding of the ATE development process. This paper will discuss various side by-side concepts. Discussions will show the interesting possibilities by fully utilizing more than one ATE.