Test of switched-capacitor ladder filters using OBT

Abstract

In this paper, a way to test switched-capacitors ladder filters by means of Oscillation-Based Test (OBT) methodology is proposed. Third-order low-pass Butterworth and Elliptic filters are considered in order to prove the feasibility of the proposed approach. A topology with a non-linear element in an additional feedback loop is employed for converting the Circuit Under Test (CUT) into an oscillator. The idea is inspired in some author's previous works (G. Huertas, D. Vázquez, A. Rueda, J.L. Huertas, Oscillation-based Test Experiments in Filters: a DTMF example, in: Proceedings of the International Mixed-Signal Testing Workshop (IMSTW'99), British Columbia, Canada, 1999, pp. 249–254; G. Huertas, D. Vazquez, E. Peralías, A. Rueda, J.L. Huertas, Oscillation-based test in oversampling A/D converters, Microelectronic Journal 33(10) (2002) 799–806; G. Huertas, D. Vázquez, E. Peralías, A. Rueda. J.L. Huertas, Oscillation-based test in bandpass oversampled A/D converters, in: Proceedings of the International Mixed-Signal Test Workshop, June 2002, Montreaux (Switzerland), pp. 39–48; G. Huertas, D. Vázquez, A. Rueda, J.L. Huertas, Practical oscillation-based test of integrated filters, IEEE Design and Test of Computers 19(6) (2002) 64–72; G. Huertas, D. Vázquez, E. Peralías, A. Rueda, J.L. Huertas, Testing mixed-signal cores: practical oscillation-based test in an analog macrocell, IEEE Design and Test of Computers 19(6) (2002) 73–82). Two methods are used, the describing function approach for the treatment of the non linearity and the root-locus method for analysing the circuit and predicting the oscillation frequency and the oscillation amplitude. In order to establish the accuracy of these predictions, the oscillators have been implemented in SWITCAP (K. Suyama, S.C. Fang, Users' Manual for SWITCAP2 Version 1.1, Columbia University, New York, 1992). Results of a catastrophic fault injection in switches and capacitors of the filter structure are reported. A specification-driven fault list for capacitors is also defined based on the sensitivity analysis. The ability of OBT for detecting this kind of faults is presented.