Prediction of analog performance parameters using oscillation based test

Abstract

Oscillation based test (OBT) is a low-cost and vectorless test technique for analog and mixed-signal integrated circuits. Previous research with OBT has focused primarily on structural issues with an emphasis on fault detection rather than determining the conformance of the circuit under test (CUT) with its specifications, or evaluation of CUT performance. This paper presents a novel methodology for efficient interpretation of OBT results. The proposed predictive oscillation based test (POBT) methodology uses adaptive regression models to predict the performance parameters of the CUT from the oscillation measurements. Simulation results indicate that, under parametric variations, this methodology can determine CUT performance parameters, resulting in enhanced test effectiveness.