Quasi-oscillation based test for improved prediction of analog performance parameters

Abstract

Oscillation based test (OBT) techniques in the past have focussed on detecting the existence of catastrophic and parametric faults. Recent work on predictive oscillation based test (POBT) has used OBT techniques to predict the performance parameters of the circuit under test (CUT). However, this technique cannot be used to predict the performance parameters of the CUT for process parameter variations that cause a loss of oscillation in test mode. This work presents a novel predictive quasi-oscillation based technique (PQOBT) to extend the usability of POBT over a wide range of process parameter variations with minimal test generation overhead.