Abstract
Time Resolved Pump Probe (TRPP) technique has been implemented to study the thermal and mechanical properties of Ge2Sb2Te5 (GST) film deposited on a silicon substrate. According to the knowledge of the thermal properties of the GST layer, the temperature dependant Thermal Boundary Resistance (TBR) at the metal-GST interface is evaluated. Measuring the acoustic oscillation and more particularly its damping leads to characterize the adhesion at the metal – GST interface. This quantity can be efficiently related to the temperature dependent TBR in the 25°C – 400°C range. The TBR increases with temperature and follows the changes of the crystalline structure of materials. A linear relation between the acoustic reflection coefficient and the logarithm of the thermal boundary resistance is found.
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