Abstract

A systematic investigation of the temperature dependent strain property in 0.5Bi(Mg1/2Ti1/2)O3-0.2 Pb(Mg1/3Nb2/3)O3-0.3PbTiO3 (0.5BMT-0.2PMN-0.3 PT) ceramic was performed in this work. Generally, the temperature dependent strain evolution was found to be seriously related to the electric field (E), i.e., with increasing temperature, a monotonic increase in the strain was observed in the low field range (E ≤ 2 kV/mm), a first increase and then decrease in the strain was observed in the middle field range (2<E ≤ 4 kV/mm), and temperature insensitive strain was obtained in the high field range (E > 4 kV/mm). The temperature and electric field dependent evolution of the phase structure was investigated by in-situ synchrotron X-ray diffraction. Overall, the different strain behaviors observed at different temperatures and electric fields are believed to be related to the stability of different phase structures at varying temperatures and electric fields.

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